Our researcher Paweł Piotr Michałowski, Ph.D., D.Sc. has a question to ask: Are you interested in SIMS, MXene, or nanotechnology? If your answer is YES, then we invite you to take part in a free webcast organized by Nature family and CAMECA titled “Secondary Ion Mass Spectrometry characterization of MAX and MXene samples – achieving atomic depth resolution for small particles”!

You’ll learn how:
–  application of the SIMS technique for MAX and MXene characterization yields important direct information about their structure
– to achieve atomic depth resolution for small particles
– SIMS unambiguously detect and identify all elements, starting with hydrogen, with atomic depth resolution, atomic layer by atomic layer

Our researcher will also present the whole process of the experiment optimization. From a rough start to a glorious finish!

Save the date now: December 13, 2022, time: 7am PST / 10am EST / 3pm GMT / 4pm CET

Fill in the form to participate in our free WEBCAST.

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Published On: 29 November 2022, 10:26|Categories: Aktualności, Charakteryzacja Materiałów i Przyrządów, Grupy Badawcze|Tags: , , , |